Some Optimum Fully and Partially Accelerated Life Testing Models in Reliability
نویسنده
چکیده
of the Ph.D. Thesis entitled Some Optimum Fully and Partially Accelerated Life Testing Models in Reliability
منابع مشابه
Design and Analysis of Step Stress Accelerated Life Tests for Censored Data}
Life testing often is consuming a very long time for testing. Therefore, the engineers and statisticians are looking for some approaches to reduce the running time. There is a recommended method for reducing the time of failure, such that the stress level of the test units will increase, and then they will fail earlier than normal operating conditions. These approaches are called accelerated li...
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< p>Accelerated Life Testing (ALT) is very important in evaluating the reliability of highly reliable products. According to ALT procedure, products undergo higher stress levels than normal conditions to reduce the failure times. ALTs have been studied for various conditions and stresses. In addition to common stress such as temperature and humidity, random usage can also be considered as anoth...
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In this paper, we consider an i.e., multiple step-stress accelerated life testing (ALT) experiment with unequal duration of time . It is assumed that the time to failure of a product follows Rayleigh distribution with a log-linear relationship between stress and lifetime and also we assume a generalized Khamis-Higgins model for the effect of changing stress levels. Taking into account that the...
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In many of the studies concerning Accelerated life testing (ALT), the log linear function between life and stress which is just a simple re-parameterization of the original parameter of the life distribution is used to obtain the estimates of original parameters but from the statistical point of view, it is preferable to work with the original parameters instead of developing inferences for the...
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Reliability is one of the main salient assets of modern electronic systems and its improvement is of utmost importance in manufacturingof high-reliability electronic products. The only possible means of improving the operational characteristics of electronic systems and reducing their overall lifecycle costs is improving their reliability. This is possible through designing in reliability at th...
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